Penetration depth of electron-doped infinite-layerSr0.88La0.12CuO2+xthin films
نویسندگان
چکیده
منابع مشابه
Penetration depth measurement in high quality YBa2Cu3O7−x thin films
The parallel plate resonator method has been used for measuring high quality YBa2Cu3O7−x (YBCO) thin films, which have low temperature residual losses comparable to those previously obtained in single crystals. The surface resistance and the real part of the conductivity show a non-monotonic behaviour with a broad peak around 45 K. The penetration depth and the real part of the conductivity var...
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ژورنال
عنوان ژورنال: Physical Review B
سال: 2010
ISSN: 1098-0121,1550-235X
DOI: 10.1103/physrevb.82.144529